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Using S-parameters as a behavioral model in System Simulation

May 6, 2020 @ 2:00 pm - 3:00 pm

Free

Using just the S-parameter measurements of a channel, we can simulate how a high-speed serial link signal will look transmitting through the interconnect. In this webinar we will look at how the interconnect features affect the S-parameters and how the S-parameters of a channel affect the eye diagram at different data rates.

Particularly we will explore the impact from losses, discontinuities and mode conversion. Using the best measurement practices, we will go from S-parameter measurements, de-embedding, exporting simulation ready S-parameters and channel simulation to analyze the eye diagrams and data dependent jitter for a variety of interconnect structures.

Presenter: Eric Bogatin, Dean of the Signal Integrity Academy
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Details

Date:
May 6, 2020
Time:
2:00 pm - 3:00 pm
Cost:
Free
Event Category:
Website:
https://go.teledynelecroy.com/l/48392/2020-02-11/7wpz7z

Venue

FREE WEBINAR
Virtual Location

Organizer

Teledyne LeCroy
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