Using S-parameters as a behavioral model in System Simulation

Using just the S-parameter measurements of a channel, we can simulate how a high-speed serial link signal will look transmitting through the interconnect. In this webinar we will look at how the interconnect features affect the S-parameters and how the S-parameters of a channel affect the eye diagram at different data rates.

Particularly we will explore the impact from losses, discontinuities and mode conversion. Using the best measurement practices, we will go from S-parameter measurements, de-embedding, exporting simulation ready S-parameters and channel simulation to analyze the eye diagrams and data dependent jitter for a variety of interconnect structures.